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Modify the :eq tests so that it's easier to tell what's happening. The expected result is the actual bit pattern. We also try to replace the actual result with one of the special values to make it easier to see what's happening too.
Implement for sbcl comparison operators from Table 4 of ieee754. Work enough logic into ieeefp-tests to be able to test booleans as well as numerical results Add test vectors for ieee754:= Make sbcl test exceptions by default
Add machinery for testing exceptions (disabled by default, enable using IEEEFP-TESTS:*TEST-EXCEPTIONS*). Include the original line in the generated test for slightly easier debugging.
Add tests for trunc() Minor cleanups of asdf system description and of ieeefp-tests.lisp
Oops. Fix typo.
Add more constants.
o Add support for hypot. This is used to test Lisp's ABS function on complex values. o Clean up some comments, remove FIXME about atan2, log10, hypot.
Add support for atan2 and log10 tests: o By adding an extra slot to TEST-VECTOR to hold the lisp function name we need to use. (Only really needed for atan2.) o By adding a log10 function for us to call.
Added *FLOAT-TYPES* and *ROUNDING-MODES* to support customization of float types and rounding modes supported by an implementation.
Add some constants for some well-known IEEE754 values and use them in the constructed tests to make it easier to read and understand what the tests are doing.
Add rudimentary report generation.
Slightly refactored version of pre-CVS test generator. implementation-dependent functions are now in a per-implementation file (which might grow into a library of ieee754-related functions... who knows?)
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